
The Discovery Xenon Flash DXF 900 platform features a patented High-Speed Xenon-pulse Delivery™ source (HSXD) and an anamorphic multi-faceted Light Pipe™. Together, these optics deliver a light pulse of unsurpassed power and uniform intensity to the specimen, while preventing sample holder over-flash. The TA Instruments High-energy Xenon design is capable of testing samples up to a diameter of 25.4 mm over a temperature range from ambient to 900°C. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites. The DXF platform is designed for research and development programs as well as production control.
DXF 900 Features
- 获得专利的高速氙气脉冲传递系统,与竞争性设计相比,在最宽的样品范围内,无论厚度或导热率如何
- Patented Light Pipe™ for the most effective collection and collimation of light, and homogeneous delivery of radiation to the sample
- 实时脉冲映射,用于薄和高导电材料的优质热扩散率
- 各种样品托盘可容纳多种样品尺寸(直径25.4毫米),形状和特殊固定装置(液体,粉末,层压板,膜等),以实现最大的样品测试灵活性
- 自动采样器with patented four-position alumina sample tray for maximum productivity
- Advanced resistance heated furnace design provides best-in-class temperature stability and uniformity across sample from RT to 900°C, and enables measurements in air, inert gas, or vacuum
- High sensitivity IR detector for optimum signal-to-noise ratio, delivering highest accuracy over the entire temperature range
- 旨在满足行业标准测试方法,包括ASTM E1461,ASTM C714,ASTM E2585,ISO 13826,ISO 22007-PART4,ISO 18755,BS ENV 1159-2,DIN 30905和DIN EN821
激光来源
类型 | 台式 |
脉搏能(可变) | Variable up to 15 Joules |
Pulse Width | 400 µs至600 µsec |
Proprietary Transfer Optics | Patented Light Pipe Beam Guide |
Furnace
温度范围 | RT to 900°C |
Atmosphere | Air, inert, Max. vacuum (50 mtorr) |
Detection
热扩散范围 | 0.01 to 1000 mm2/s |
导热系数Range | 0.1 to 2000 W/(m*K) |
Data Acquisition | 16 bit |
Accuracy
热扩散率 | ±2.3% |
导热系数 | ±4% |
可重复性
热扩散率 | ±2.0% |
导热系数 | ±3.5% |
Sample
Round | 8, 10, 12.7, & 25.4 mm Diameter |
正方形 | 8、10和12.7毫米长 |
最大厚度 | 10毫米 |
自动采样器
类型 | 四位置托盘,惰性, Max. vacuum 50mtorr |
High-Speed Xenon-Pulse Delivery™ (HXSD) Source
High-Speed Xenon-Pulse Delivery™ (HXSD) Source
The DXF 900 features a proprietary High-Speed Xenon-pulse Delivery™(HSXD) source that delivers 50% more energy than competitive Xenon systems. The patented design is comprised of a Xenon source focused on one mirror that produces a highly uniform flash. With 15 Joules of energy, the flash produced by the HSXD is the most powerful and most uniform flash of any Xenon system available on the market, and allows the ability to test thicker lower conductivity samples.
Patented Light Pipe and Neutral Density IR Filters
专利的轻型管和中性密度IR滤清器,无与伦比的精度
TA Instruments’ patented wave guide Light Pipe collects and collimates the HSXD source flash, efficiently delivering energy directly to the sample. This unique, highly efficient optical path yields a homogeneous, high quality radiation, maximizing the energy reaching the sample surface. The IR intensity is tuned to the optimal detector range through the use of neutral density IR filters. Unlike systems that rely on multiple apertures or iris design to attenuate intensity, the neutral density filter provides a uniform moderation of intensity and is free from geometry factors and spectral band distortion. These carefully designed detector optics lead to unparalleled accuracy across the full range of thermal diffusivity.
Flexible, Multi-Position Sample Holders
Flexible, Multi-Position Sample Holders
The sample containment system utilizes linear sample holding trays for fast and easy loading. A rim at the bottom of the sample holder supports the specimen, so it is free of any pressure or clamping and well-suited for delicate specimens. The patented* linear design guarantees a perfect positioning of the sample holder in alignment with the flash radiation.
Users can choose between a selection of sample holders which can accommodate two or four samples from 8 mm up to 25.4 mm in size, and of round or square shape. For samples that require specific sample holders, TA Instruments offers a variety of accessories for liquids, powders, laminates, and materials with extremely high thermal diffusivity.
*US 6,375,349B1
Consistent Data from -150°C to 900°C
Consistent Data from -150°C to 900°C
Often high performance materials need to be characterized from extremely low to high temperatures. The graph on the lower right shows an oxygen-free high thermal conductivity copper (OFHC) reference material in which thermal conductivity was measured from -150°C to 900°C with both a DXF 200 and DXF 900.
All the measurements fall within ±1.5% of the reference values. Note the agreement of the values between ambient and 200˚C
Accuracy of Xenon Flash
Accuracy of Xenon Flash
Pyroceram®,一种用于高温应用的玻璃陶瓷已有30多年的历史,用作验证高温下热热管理特性的材料。Pyroceram®9606是一种可从NIST提供的标准参考材料(SRM),在DXF 900上测试到700°C的温度,以证明TA仪器Xenon闪光技术的准确性至高温。bob手机版官网登录右上角的图显示结果与标准参考值非常吻合。
*Pyroceram®是Corning Incorporated的注册商标
The Proven Software Platform for Easy, Accurate Flash Analysis Data
所有Discovery Light Flash仪器均包括用于仪器控制和数据分析的Flashline™软件。基于Microsoft Windows的软件具有直观的基于桌面的格式,用于仪表控制接口中实验参数的简单编程。实时监控允许在每次测试期间立即评估数据质量和仪器性能。数据分析模块的自动例程为用户提供了高级分析工具,包括用于传导和辐射中的热损失校正模型。
闪光线与脉搏形映射测量系统集成,确定激光脉冲的确切形状与时间以进行脉冲形状和宽度校正。它还标识了闪光灯零来源,并实现有限的脉冲效应校正,这对于确保薄样品和高膨胀材料的准确测量至关重要。此外,TA仪器开发了“适合的优点”评估工具,使用户可以选择由不同的热扩散模型计算得出的最佳结果。
软件功能:
- Unlimited temperature segments with user-defined heat ramp steps
- User-selectable laser energy for each sample by temperature segment
- 测试过程中所有已经完成的细分市场的数据分析
- Determination of the specific heat by comparative method
- Option for automatic multiple-shots selection and averaging
- Correction for radiation component of transparent and translucent samples
- Automatic optimization of flash energy level
- Option for sample skip, and precision criterion
- Fast zoom function for X and Y segments
- 热扩散率,比热和热导率表和图作为温度的函数
- Calculations of all models during testing and available by the completion of testing
Standard models include:
- 用于多维热损耗校正和非线性回归的Gembarovic
- 适合最佳模型结果选择的优点
- Pulse gravity center to determine t0
- 脉冲长度和形状校正
- Two and three layers analysis
- In-plane
- Main models: Clark and Taylor, Cowan, Degiovanni, Koski, Least Squares, Logarithmic, Moment, Heckman, Azumi, and Parker
- 描述
-
The Discovery Xenon Flash DXF 900 platform features a patented High-Speed Xenon-pulse Delivery™ source (HSXD) and an anamorphic multi-faceted Light Pipe™. Together, these optics deliver a light pulse of unsurpassed power and uniform intensity to the specimen, while preventing sample holder over-flash. The TA Instruments High-energy Xenon design is capable of testing samples up to a diameter of 25.4 mm over a temperature range from ambient to 900°C. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites. The DXF platform is designed for research and development programs as well as production control.
- Features
-
DXF 900 Features
- 获得专利的高速氙气脉冲传递系统,与竞争性设计相比,在最宽的样品范围内,无论厚度或导热率如何
- Patented Light Pipe™ for the most effective collection and collimation of light, and homogeneous delivery of radiation to the sample
- 实时脉冲映射,用于薄和高导电材料的优质热扩散率
- 各种样品托盘可容纳多种样品尺寸(直径25.4毫米),形状和特殊固定装置(液体,粉末,层压板,膜等),以实现最大的样品测试灵活性
- 自动采样器with patented four-position alumina sample tray for maximum productivity
- Advanced resistance heated furnace design provides best-in-class temperature stability and uniformity across sample from RT to 900°C, and enables measurements in air, inert gas, or vacuum
- High sensitivity IR detector for optimum signal-to-noise ratio, delivering highest accuracy over the entire temperature range
- 旨在满足行业标准测试方法,包括ASTM E1461,ASTM C714,ASTM E2585,ISO 13826,ISO 22007-PART4,ISO 18755,BS ENV 1159-2,DIN 30905和DIN EN821
- Specifications
-
激光来源
类型 台式 脉搏能(可变) Variable up to 15 Joules Pulse Width 400 µs至600 µsec Proprietary Transfer Optics Patented Light Pipe Beam Guide Furnace
温度范围 RT to 900°C Atmosphere Air, inert, Max. vacuum (50 mtorr) Detection
热扩散范围 0.01 to 1000 mm2/s 导热系数Range 0.1 to 2000 W/(m*K) Data Acquisition 16 bit Accuracy
热扩散率 ±2.3% 导热系数 ±4% 可重复性
热扩散率 ±2.0% 导热系数 ±3.5% Sample
Round 8, 10, 12.7, & 25.4 mm Diameter 正方形 8、10和12.7毫米长 最大厚度 10毫米 自动采样器
类型 四位置托盘,惰性,
Max. vacuum 50mtorr - 技术
-
High-Speed Xenon-Pulse Delivery™ (HXSD) Source
High-Speed Xenon-Pulse Delivery™ (HXSD) Source
The DXF 900 features a proprietary High-Speed Xenon-pulse Delivery™(HSXD) source that delivers 50% more energy than competitive Xenon systems. The patented design is comprised of a Xenon source focused on one mirror that produces a highly uniform flash. With 15 Joules of energy, the flash produced by the HSXD is the most powerful and most uniform flash of any Xenon system available on the market, and allows the ability to test thicker lower conductivity samples.
Patented Light Pipe and Neutral Density IR Filters
专利的轻型管和中性密度IR滤清器,无与伦比的精度
TA Instruments’ patented wave guide Light Pipe collects and collimates the HSXD source flash, efficiently delivering energy directly to the sample. This unique, highly efficient optical path yields a homogeneous, high quality radiation, maximizing the energy reaching the sample surface. The IR intensity is tuned to the optimal detector range through the use of neutral density IR filters. Unlike systems that rely on multiple apertures or iris design to attenuate intensity, the neutral density filter provides a uniform moderation of intensity and is free from geometry factors and spectral band distortion. These carefully designed detector optics lead to unparalleled accuracy across the full range of thermal diffusivity.
Flexible, Multi-Position Sample Holders
Flexible, Multi-Position Sample Holders
The sample containment system utilizes linear sample holding trays for fast and easy loading. A rim at the bottom of the sample holder supports the specimen, so it is free of any pressure or clamping and well-suited for delicate specimens. The patented* linear design guarantees a perfect positioning of the sample holder in alignment with the flash radiation.
Users can choose between a selection of sample holders which can accommodate two or four samples from 8 mm up to 25.4 mm in size, and of round or square shape. For samples that require specific sample holders, TA Instruments offers a variety of accessories for liquids, powders, laminates, and materials with extremely high thermal diffusivity.
*US 6,375,349B1
- 表现
-
Consistent Data from -150°C to 900°C
Consistent Data from -150°C to 900°C
Often high performance materials need to be characterized from extremely low to high temperatures. The graph on the lower right shows an oxygen-free high thermal conductivity copper (OFHC) reference material in which thermal conductivity was measured from -150°C to 900°C with both a DXF 200 and DXF 900.
All the measurements fall within ±1.5% of the reference values. Note the agreement of the values between ambient and 200˚C
Accuracy of Xenon Flash
Accuracy of Xenon Flash
Pyroceram®,一种用于高温应用的玻璃陶瓷已有30多年的历史,用作验证高温下热热管理特性的材料。Pyroceram®9606是一种可从NIST提供的标准参考材料(SRM),在DXF 900上测试到700°C的温度,以证明TA仪器Xenon闪光技术的准确性至高温。bob手机版官网登录右上角的图显示结果与标准参考值非常吻合。
*Pyroceram®是Corning Incorporated的注册商标
- Software
-
The Proven Software Platform for Easy, Accurate Flash Analysis Data
所有Discovery Light Flash仪器均包括用于仪器控制和数据分析的Flashline™软件。基于Microsoft Windows的软件具有直观的基于桌面的格式,用于仪表控制接口中实验参数的简单编程。实时监控允许在每次测试期间立即评估数据质量和仪器性能。数据分析模块的自动例程为用户提供了高级分析工具,包括用于传导和辐射中的热损失校正模型。
闪光线与脉搏形映射测量系统集成,确定激光脉冲的确切形状与时间以进行脉冲形状和宽度校正。它还标识了闪光灯零来源,并实现有限的脉冲效应校正,这对于确保薄样品和高膨胀材料的准确测量至关重要。此外,TA仪器开发了“适合的优点”评估工具,使用户可以选择由不同的热扩散模型计算得出的最佳结果。
软件功能:
- Unlimited temperature segments with user-defined heat ramp steps
- User-selectable laser energy for each sample by temperature segment
- 测试过程中所有已经完成的细分市场的数据分析
- Determination of the specific heat by comparative method
- Option for automatic multiple-shots selection and averaging
- Correction for radiation component of transparent and translucent samples
- Automatic optimization of flash energy level
- Option for sample skip, and precision criterion
- Fast zoom function for X and Y segments
- 热扩散率,比热和热导率表和图作为温度的函数
- Calculations of all models during testing and available by the completion of testing
Standard models include:
- 用于多维热损耗校正和非线性回归的Gembarovic
- 适合最佳模型结果选择的优点
- Pulse gravity center to determine t0
- 脉冲长度和形状校正
- Two and three layers analysis
- In-plane
- Main models: Clark and Taylor, Cowan, Degiovanni, Koski, Least Squares, Logarithmic, Moment, Heckman, Azumi, and Parker